Design effect

Results: 824



#Item
331Market research / Survey methodology / Design of experiments / Multistage sampling / Simple random sample / Stratified sampling / Sample / Design effect / Statistical unit / Statistics / Sampling techniques / Sampling

OVERVIEW NOAA’s Center for Coastal Monitoring and Assessment Biogeography Team’s Sampling Tool (Sampling Tool) provides users a means to efficiently develop sampling strategy for a population, be it people, animals,

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Source URL: www.ccma.nos.noaa.gov

Language: English - Date: 2008-06-16 10:42:35
332Integrated circuits / Electronic design / Semiconductor devices / Logic families / Digital electronics / MOSFET / Multigate device / CMOS / Field-effect transistor / Electronic engineering / Electronics / Technology

Performance Study of Nano-Scale Transistor with Conventional Transistor A THESIS SUBMITTED IN PARTIAL FULFILLMENT OF THE REQUIREMENT FOR THE DEGREE OF

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Source URL: ethesis.nitrkl.ac.in

Language: English - Date: 2010-05-17 23:50:11
333Business / Computer-aided design / Manufacturing engineering / Industrial engineering / Tool and die maker / Joseph M. Juran / Mechanical engineering / Technology / Engineering / Manufacturing

What Can I Do With This Degree? Bachelor of Science in Manufacturing Engineering Technology WORK ACTIVITIES Manufacturing Engineers, also called Industrial Engineers, create efficient and cost effect

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Source URL: ferris.edu

Language: English - Date: 2014-10-22 08:44:53
334Software design / Diagrams / Knowledge representation / Unified Modeling Language / Modeling language / Object-oriented analysis and design / State diagram / Object-oriented design / Class / Software engineering / Object-oriented programming / UML diagrams

Syllabus for MCA Semester – IV (with effect from the academic year[removed]JAVA PROGRAMMING Lecture : 4 Hrs/week One paper: 100 marks / 3 Hrs duration Term work: 25 marks

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Source URL: www.mu.ac.in

Language: English - Date: 2009-08-11 07:37:44
335MOSFET / Electronic design / Capacitance / Common source / Field-effect transistor / CMOS / Electromagnetism / Electronic engineering / Electronics

RF Modeling of 45nm Low-Power CMOS Technology Jing Wang*, Hongmei Li**, Li-Hong Pan*, Usha Gogineni***, Robert Groves*, Basanth Jagannathan*, Myung-Hee Na*, William Tonti** and Richard Wachnik* * IBM Semiconductor Resea

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Source URL: www.nsti.org

Language: English - Date: 2014-06-04 17:41:40
336Statistical theory / Estimation theory / Statistical methods / Optimal design / Fisher information / Gamma distribution / Statistics / Design of experiments / Regression analysis

Chapter 10 BAYESIAN DESIGNS FOR THE TWO REGRESSOR MODEL §10.1 Motivation While optimal and conditionally optimal designs can be found in terms of IECs, the main effect

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Source URL: scholar.lib.vt.edu

Language: English - Date: 1998-11-04 14:05:10
337Electronic design / Power electronics / Diode / Threshold voltage / Transistor / MOSFET / Thyristor / CMOS / Field-effect transistor / Electrical engineering / Electronic engineering / Electromagnetism

QFET TM FQP30N06L 60V LOGIC N-Channel MOSFET

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Source URL: dlnmh9ip6v2uc.cloudfront.net

Language: English - Date: 2011-11-29 14:47:22
338Electronic design / Power MOSFET / Diode / MOSFET / Field-effect transistor / CMOS / Threshold voltage / Transistor / Organic field-effect transistor / Electronics / Electronic engineering / Electrical engineering

BSS138 N-Channel Logic Level Enhancement Mode Field Effect Transistor

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Source URL: allelcdn.upshotcommerce.com

Language: English - Date: 2014-03-24 13:38:44
339Quality / Statistical methods / Systems engineering / Fractional factorial design / Factorial / Optimal design / Main effect / Response surface methodology / Variance / Statistics / Design of experiments / Industrial engineering

Chapter 9 MISCELLANEOUS RESPONSE SURFACE TOPICS: PREDICTION VARIANCE AND FRACTIONAL FACTORIALS §9.1

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Source URL: scholar.lib.vt.edu

Language: English - Date: 1998-11-04 14:05:10
340Reliability / Measuring instrument / Thermomechanical analysis / Failure analysis / Electron microscope / Dynamic mechanical analysis / Atomic force microscopy / Characterization / MIL-STD-883 / Science / Materials science / Scientific method

Fraunhofer Institute for Reliability and M i c r o i n t e g r at i o n I Z M Focused Ion Beam • Design parameter effect analysis (geometry, material, load profile)

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Source URL: www.izm.fraunhofer.de

Language: English - Date: 2015-02-12 09:57:08
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